Jason J Ellison 于 2017 年 12 月获得宾夕法尼亚州立大学电气工程理学硕士学位。 他受聘为信号完整性工程师，负责开发高速互连、实验室自动化技术和校准技术。他的兴趣是信号完整性、电源完整性和嵌入式系统设计。他还为《The Signal Integrity Journal》等期刊撰写技术类发表作品。 Ellison 先生是活跃的 IEEE 成员和 DesignCon 技术程序委员会成员。
I’ve talked about COM and channel analysis in previous blogs, and I’d like to continue the discussion with more visual
Read to learn an introduction about S-parameter analysis. This article covers how to identify port maps, what insertion loss and return loss looks like, how the various S-parameters look in the time-domain, and some additional analysis techniques to use when data mining S-parameters.
We often hear about how time-domain simulations require causal S-parameters. We’ll explore what S-parameter causality means and what non-causal S-parameters do to channel analysis.
If you’re reading an Altium Blog, it’s probably safe to say that you’ve either designed or fabricated printed circuit boards
Altium Concord Pro™ as a standalone product and brand name has been discontinued and the capabilities are now available as
As with any job, Signal Integrity engineers use niche tools. SI tools are often thought of as S-parameter viewers, 3D
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